Multimodal Characterization of Energy Materials using
TESCAN Plasma FIB-SEM with integrated ToF-SIMS
Jiri Dluhos
Title: Product Manager, FIB-SEM for Materials Science,
Email: jiri.dluhos@tescan.com
Affiliation: TESCAN Group, a.s
Jiri Dluhos is a Product Manager for FIB-SEM systems at TESCAN GROUP, Brno, Czech Republic. His background in materials science and previous positions in the company - Application Specialist and R&D Specialist for FIB-SEM - have given him a comprehensive overview of electron microscopy, focused ion beam technology, its applications and overall contribution to microanalytical tasks, with a particular focus on 3D multimodal materials characterization using FIB-SEM.
Abstract
The primary goals of materials research in energy materials are to optimize production processes, enhance the performance of existing technologies, and develop new types of materials. Fulfillment of innovations requirements is based on the effective, comprehensive, structural, and chemical multiscale characterization of materials.
High resolution imaging capability of a Scanning Electron Microscope combined with precise removal of large volumes of material using a plasma Focused Ion Beam (FIB-SEM) and nano analytical techniques like Energy Dispersive X-Ray Spectrometry (EDS) Electron Backscattered Diffraction (EBSD) or Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) brings new possibilities in correlated 3D microscopy and spectroscopy.
In our contribution, we would like to illustrate the information obtainable by adding ToF-SIMS measurement into the serial-sectioning workflow (3D ToF-SIMS) and in combination with EDS (3D EDS), for characterization of 3D distribution of Li and Li-based molecules in battery research and material development for energy storage.
Application area: Battery research, Energy storage materials, Materials development, Multiscale characterization
