MESA-7220V2

Key Features :

• Dynamic Analysis Range:
  • Sulfur: 0.7 ppm - 10.0Wt%
  • Chlorine: 0.6 ppm - 10.0Wt%
• Auto Ranging for extended curves.
• No purge gases required.
• Maximum 60 calibration curves and 300 data points per curve.
• Calibration curves can be edited after they have been saved.
• Measurement times from 30 – 999 sec.
• Measurement repeats from 1 – 99 times.
• Oxygen correction feature eliminates interference which can affect Sulfur readings.
• Various sample types* [Solids, Liquids, Powders, Pastes, Pellets, and Films] can be measured.
• Can program up to 20 Admin & User accounts.
• User replaceable Kapton window.
• Micrometer adjustment of graphite crystal angle for better sensitivity.
• Stand-alone PC to allow software updates electronically.
• Built-in interlocks to protect end-user from X-rays.
• Silicon Drift Detector/X-ray Beryllium Window.

Measuring Principle :

The pulse-height analyzer counts the number of electric pulses from the X-rays which come into each window, during a given time, and obtains the integrated values. These values are then converted into a count per second and used in the calculations. The quantities of X-rays which come into the windows are called the quantity of fluorescent X-rays from sulfur, NS (cps), the quantity of fluorescent X-rays from chlorine, NCI (cps), and the quantity of scattered X-rays, NB (cps), respectively

The analyzer calculates the K value, which is the ratio of NS to NB (K = NS/NB) or NCI to NB (K = NCI/NB) and uses it as the measured value. The determined value (ppm) is read from the K value compared to the calibration curve.

When the high-voltage power is sent to the X-ray tube,the primary X-rays are radiated from the X-ray tube to the curved crystal. X-rays irradiated to the curved crystal are monochromatied by the curved crystal and irradiated on the sample cell. Some of the radiated X-rays excite the sulfur and chlorine atoms, generating fluorescent X-rays. These fluorescent and any remaining scattered X-rays are detected by the X-ray detector. In the X-ray detector, electric pulses are generated in proportion to the energy of the incoming X-rays. These electric pulses are strengthened by the pulse amplifier before being sent as a voltage signal to the pulse-height analyzer.

Specifications :