A New Class of Atomic Force Microscope: The Automatic AFM
Park FX40 transforms atomic force microscopy, placing user benefits at the forefront through groundbreaking autonomy and advanced technology. Integrated intelligence and robotics automate set up and scanning tasks, freeing researchers from manual operations. This includes managing probes, alignment, sample positioning, and imaging optimization, allowing users to focus on their specialized work. With improved electromechanics, noise reduction, and multi-sample imaging, the FX40 streamlines data collection, research workflows, and data publication, empowering accelerated scientific progress and discovery.
AI-Driven Automation
The Most Intelligent AFM Ever Experienced with AI Robotics Technology
The only AFM to automate all setup and scanning processes with the simple click of a button, Park FX40 automatically changes and replaces its own tips, to avoid any contamination or user-related errors. Operators are offered tip choices including the type, model, application, and usage.
.Automatic Probe Reading
The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to quickly select the best probe tip for each job.
Automatic Probe Exchange
With automated probe exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.
Automatic Beam Alignment
Automatic Beam Alignment positions the laser beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. It shifts the X,Y and Z axis for clearer images, with no distortion, all autonomously at the click of a button.
Safety Features
- Maximizing to Protect Your Sample
- Environmental Sensors
- Safety Probe Pickup
Applications
- Nano-scale Topography Measurements by AFM
- Graphene on hBN
- Moiré imaging with conductive atomic force microscopy
- Electrostatic artifacts in magnetic force microscopy measurement
- Defects of LiNbO3 wafer
- Investigating the effect of temperature on Young's modulus of polymer materials through the application of AFM