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Brand: Heidelberg Instruments
Category: Lithography Tools
Industry: Life Science and Biotechnology, Academia, Material Science & Chemistry
The MLA 150 Maskless Aligner uses advanced DMD-based digital lithography to create precise micro-patterns without traditional photomasks, enabling faster design-to-substrate processing.
The MLA 150 maskless aligner represents a new generation of lithography systems designed to replace traditional mask-based technology with a faster, more flexible, and easy-to-use solution. By using a Digital Mirror Device (DMD) as a dynamic mask, the system eliminates the need for physical photomasks, significantly reducing both cost and turnaround time in microfabrication workflows.
Unlike conventional photolithography systems, the MLA 150 allows researchers and engineers to move directly from a digital design to a perfectly patterned substrate within minutes. This maskless approach enables rapid prototyping, design iteration, and highly precise patterning, making it ideal for modern research environments where speed and flexibility are essential.
The MLA 150 provides outstanding performance and accuracy for a wide range of advanced applications including quantum device fabrication, MEMS development, micro-optics, photonics, and life sciences research. Its intuitive software interface and streamlined workflow allow users to easily modify patterns, test new designs, and accelerate experimental development without the delays associated with mask production.
With its combination of high resolution, digital mask flexibility, and fast processing, the MLA 150 maskless aligner has become a preferred solution for research laboratories, universities, and semiconductor innovation centers working on next-generation micro and nanofabrication technologies.
Labindia Instruments Pvt. Ltd. is the authorised dealer in India, providing advanced lithography and microfabrication solutions for semiconductor, nanotechnology, and research laboratories.
| Module | Functionality |
|---|---|
| Exposure Wavelength | Diode lasers at 375 nm and/or 405 nm; interchangeable for different photoresists |
| Exchangeable Chucks | Custom vacuum layouts for various substrates |
| Draw Mode | Overlay BMP files on live camera image for direct patterning |
| Autofocus | Air-gauge or optical autofocus for small samples (<10 mm) |
| Variable Substrate Sizes | 3–6″ standard; up to 8″ on request |
| Advanced Field Alignment | Automatic field-by-field alignment for individual dies on the wafer |
| Write Mode I * | Write Mode II * | |
|---|---|---|
| Writing performance | ||
| Minimum feature size [μm] | 0.6 (0.45 optional) | 1 |
| Minimum Lines and Spaces [μm] | 0.8 (0.45 optional) | 1.2 |
| Global 2nd layer alignment [nm] | 500 | 500 |
| Local 2nd layer alignment [nm] | 250 | 250 |
| Backside alignment [nm] | 1000 | 1000 |
| Max. write speed 405 nm laser [mm²/min] | 400 | 1400 |
| Max. write speed 375 nm laser [mm²/min] | 400 | 600 |
| System features | |
|---|---|
| Light source | Diode lasers: 8 W at 405 nm, 2.8 W at 375 nm, or both |
| Substrate sizes | Variable: 3 x 3 mm² to 9″ x 9″ | Customizable on request |
| Substrate thickness | 0 - 12 mm |
| Maximum exposure area | 150 x 150 mm² | Optional: 200 x 200 mm² |
| Temperature controlled flow box | Temperature stability ± 0.1 °C |
| Real-time autofocus | Air-gauge or optical |
| Autofocus compensation range | 180 μm |
| Grayscale | 128 gray levels |
| Software features | Exposure wizard, resist database, automatic labeling and serialization, Draw Mode for CADless exposures, substrate tracking / history |
| System dimensions (lithography unit) | |
| Height × width × depth | 1950 mm × 1300 mm × 1300 mm |
| Weight | 1100 kg |
| Installation requirements | |
| Electrical | 230 VAC ± 5%, 50/60 Hz, 16 A |
| Compressed air | 6 - 10 bar |
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