Park NX10 AFM Price | Park Systems | Labindia Instruments

Outstanding NX Mechanical Design
Enhanced XY and Z scanner performance ensures precise positioning and accurate imaging. Fast Z-servo response improves vertical tracking, while improved Z scan straightness delivers distortion-free nanoscale measurements.

Low Z Detector Noise
Equipped with a stacked piezo actuator and strain gauge sensor, the NX10 achieves high precision with exceptionally low noise—essential for reliable, repeatable measurements.

Fast Z Servo & High Resolution Imaging
The advanced Z scanner maintains consistent roughness linearity across both flat and rough samples, ensuring dependable results regardless of scan size.

NX Laser Beam Path
Integrated superluminescent diode (SLD) provides low-coherence illumination, reducing interference for stable signal detection. Precision mirrors guide the beam accurately to the cantilever and PSPD.

Intuitive Laser Adjustment
Direct X and Y control knobs allow easy laser beam positioning and effortless realignment during probe replacement.

Pre-Mounted Probe System
Pre-aligned probe chip carriers with kinematic mounting points reduce cantilever damage and ensure consistent tip positioning.

Secure Kinematic Mounting
The NX head Z scanner uses precision balls and magnetic mounting for stable, repeatable installation and minimized drift.

Improved Z Scan Straightness
Maintains 0.1% straightness across the scan range with less than 5 nm out-of-axis motion at full 15 µm extension for highly accurate vertical measurements.

Modular Expansion Slot
Easily upgrade with plug-in modules to enable advanced AFM modes, ensuring flexibility and long-term system scalability.

On-Axis Optical Microscope
High-power optical microscope with software-controlled LED illumination provides a clear, well-lit view of the sample surface for precise positioning.