Park NX7
NT21XHWO
Brand: Park Systems
Category: Atomic Force Microscopes
Industry: Life Science and Biotechnology, Academia, Semiconductors, Material Science & Chemistry, Paint, Pigments & Polymers
Accessible nanometrology for academic research
| Application Images | Description | Scanning Conditions |
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Few layers of MnBi₂Te₄: 2D Materials
Few-layer MnBi₂Te₄ (MBT), a material of interest in 2D materials research and topological insulators, was characterized in True Non-contact mode. The scan image reveals the layered surface topography with a peak-to-valley height of about 85.9 nm. |
- System: NX7 • Sample courtesy: School of physical and mathematical sciences, Nanyang Technological University, Singapore |
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Adenovirus with DNA bundle: Biological Materials The adenovirus sample with a DNA bundle was characterized in True Non-contact mode. The scan image reveals the viral particle and associated DNA structures with a peak-to-valley height of about 24.5 nm. |
- System: NX7 - Scan Mode: True Non-contact™ mode - Scan Rate: 1.87 Hz - Scan Size: 1 µm × 1 µm - Pixel Size: 256 × 256 pixels - Peak-to-valley: 24.5 nm |
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Polyvinylidene fluoride (PVDF): Polymers The surface of PVDF beads dissolved by chloroform was imaged in True Non-contact mode. The scan image reveals nanoscale surface features with a peak-to-valley height of about 238.7 nm. |
- System: NX7 - Scan Mode: True Non-contact™ mode - Scan Rate: 1 Hz - Scan Size: 10 µm × 10 µm - Pixel Size: 512 × 512 pixels - Peak-to-valley: 238.7 nm |
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Graphene on hBN: 2D Materials Graphene on hexagonal boron nitride (hBN), a widely studied 2D heterostructure, was characterized using Conductive AFM (C-AFM). The current image reveals a Moiré pattern, with a peak-to-valley value of about 52.7 nA. |
- System: NX7 - Scan Mode: Conductive AFM (C-AFM), (Channel: Current) - Scan Rate: 20 Hz - Scan Size: 50 nm × 50 nm - Pixel Size: 512 × 512 pixels - Peak-to-valley: 52.7 nA |
