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Brand: Park Systems
Category: Microscope - Atomic Force
Industry: Life Science and Biotechnology, Academia, Semiconductors, Material Science & Chemistry, Paint, Pigments & Polymers
The Park NX12 Atomic Force Microscope (AFM) is a specialized research platform designed for advanced materials science, electrochemical, and biochemical applications. Built to deliver high-resolution nanoscale imaging and property characterization, the NX12 operates seamlessly in both ambient and liquid environments—making it ideal for studying dynamic processes in real time.
What sets the NX12 apart is its integration of scanning probe techniques with an inverted optical microscope. This powerful combination allows researchers to correlate structural, mechanical, electrical, and optical information from the exact same region of a sample, enabling deeper insight and more comprehensive analysis.
At its core, the NX12 incorporates Park Systems’ True Non-contact™ mode and proprietary orthogonal scan system, ensuring artifact-free imaging and precise separation of XY and Z movements. These technologies are further enhanced with advanced nanopipette-based techniques, enabling accurate topography mapping alongside localized property measurements.
The NX12 supports highly specialized experiments, including non-invasive in-liquid imaging of live cells using Scanning Ion Conductance Microscopy (SICM) and high-resolution mapping of local electrochemical reactivity with SECM/SECCM techniques. A digitally controlled environmental chamber maintains stable gas composition and temperature, ensuring reproducible, reliable results across sensitive experiments.
From live-cell imaging and electrochemical analysis to advanced materials characterization, the Park NX12 provides a versatile and powerful solution for researchers seeking comprehensive nanoscale insight in complex environments.
Integration with Inverted Optical Microscopy: Combines wide field-of-view optical imaging with nanoscale AFM resolution for precise correlative analysis on the same sample area.
Fast Z Servo & High Resolution: Stacked piezo actuator and strain gauge sensor deliver rapid vertical response and accurate measurements across flat to rough surfaces.
Stable NX Laser Beam Path: Superluminescent diode (SLD) minimizes optical interference for stable signal detection and precise alignment to the cantilever and PSPD.
Easy Laser Adjustment: Intuitive X–Y control knobs allow quick beam positioning and effortless realignment during probe replacement.
Improved Z Scan Straightness: Maintains ≤0.1% straightness with <5 nm out-of-axis motion at 15 µm extension, ensuring distortion-free nanoscale measurements.
Nanopipette-Based Applications: Supports advanced techniques such as SICM, SICM-SECM, and SECCM for electrochemical and ionic imaging beyond surface topography.
Versatile Research Platform: Ideal for materials science, electrochemical studies, and biological research requiring nanoscale structural and functional analysis.
| Application Images | Description | Scanning Conditions |
| Giardia in liquid: A Giardia sample in liquid was imaged using Tapping mode. The topographical image clearly shows the surface structure of the microorganism, with a peak-to-valley height variation of approximately 2.8 µm. | - System: NX12 - Scan Mode: Tapping mode - Scan Rate: 0.2 Hz - Scan Size: 100 µm × 100 µm - Pixel Size: 512 × 512 pixels - Peak-to-valley: 2.8 µm |
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| Lung cancer cell: A lung cancer cell was imaged using Scanning Ion Conductance Microscopy (SICM). The topographical image reveals detailed surface structures of the cell, showing a peak-to-valley height variation of approximately 8.17 µm. | - System: NX12 - Scan Mode: Scanning Ion Conductance Microscopy - Scan Rate: 0.3 Hz - Scan Size: 60 µm × 60 µm - Pixel Size: 256 × 256 pixels - Peak-to-valley: 8.17 µm |
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| Sunflower pollen: A sunflower pollen grain was imaged using True Non-Contact™ mode. The topographical image reveals the surface pattern of the pollen, showing a peak-to-valley height variation of approximately 13 µm. | - System: NX12 - Scan Mode: True Non-contact™ mode - Scan Rate: 0.1 Hz - Scan Size: 10 µm × 10 µm - Pixel Size: 256 × 256 pixels - Peak-to-valley: 13 µm |
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| Cellguard: A Cellguard sample was imaged using Fast PinPoint™ mode. The topographical image shows nanoscale surface features of the material, with a peak-to-valley height variation of approximately 313 nm. |
- System: NX12 |
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