Park FX200 AFM | Park Systems | Labindia Instruments

The Park FX200 Atomic Force Microscope (AFM) is an advanced large-sample AFM platform engineered to accommodate samples up to 200 mm, making it ideal for semiconductor wafers, advanced materials, and industrial research applications. Designed with a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX200 delivers highly precise and repeatable nanoscale measurements across large sample areas.

Like all Park Systems AFMs, the FX200 incorporates the proprietary orthogonal scan system and True Non-contact™ mode, ensuring artifact-free, high-resolution metrology while protecting delicate or fragile samples. This combination enables accurate topography and property characterization without compromising sample integrity.

The FX200 is built to maximize productivity. It features automatic probe exchange, automatic laser beam alignment, and a full 200 mm sample-view camera, allowing users to easily navigate and measure across large substrates. Automated scan parameter optimization and optical autofocus further reduce setup time, while sequential multi-position measurements streamline high-throughput workflows.

Powerful data analysis tools support comprehensive nanoscale characterization, making the FX200 suitable for both research laboratories and industrial quality control environments. Whether analyzing semiconductor wafers, thin films, or precision-engineered materials, the Park FX200 delivers reliable performance, advanced automation, and user-friendly operation in one integrated AFM solution.