Park NX20 300mm
YEOPTDBT
Brand: Park Systems
Category: Microscope - Atomic Force
Industry: Academia, Semiconductors, Material Science & Chemistry
The leading nanometrology tool bridging research and industry
| Application Images | Description | Scanning Conditions |
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Cu Pad Oxidation: Oxidation on a Cu pad was characterized in True Non-contact mode. The scan revealed a peak-to-valley height difference of 120.7 nm, and the image shows localized oxidation features on the pad surface. | - System: NX20 300mm - Scan Mode: True Non-contact - Scan Rate: 1 Hz - Scan Size: 40 µm × 40 µm - Pixel Size: 1024 × 512 pixels - Peak-to-valley: 120.7 nm |
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Artificial Spin Ice lattice: An artificial spin ice lattice was measured using Magnetic Force Microscopy (MFM), providing phase information of the magnetic response. The image highlights the characteristic ball-like arrangement of the artificial lattice. | - System: NX20 300mm - Scan Mode: Magnetic Force Microscopy (Channel: MFM Phase) - Scan Rate: 0.5 Hz - Scan Size: 33 µm × 33 µm - Pixel Size: 2048 × 2048 pixels |
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PMN-PT: A PMN-PT sample was measured using Piezoresponse Force Microscopy (PFM). The lateral PFM phase image highlights the domain orientation and lateral response of the ferroelectric material. | - System: NX20 300mm - Scan Mode: Piezoresponse Force Microscopy (Channel: Lateral PFM Phase) - Scan Rate: 0.3 Hz - Scan Size: 10 µm × 10 µm - Pixel Size: 256 × 256 pixels |
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Polyvinyl Alcohol (PVA) Transfer: The surface of a polyvinyl alcohol (PVA) transfer sample was characterized in Tapping mode. The resulting image highlights significant roughness from the transfer process, with a peak-to-valley height difference of 168.2 nm. | - System: NX20 300mm - Scan Mode: Tapping - Scan Rate: 1 Hz - Scan Size: 10 µm × 10 µm - Pixel Size: 256 × 256 pixels - Peak-to-valley: 168.2 nm |
