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Brand: Tescan
Category: Scanning Electron Microscopes
Industry: Battery, Life Science and Biotechnology, Academia, Semiconductors, Material Science & Chemistry
The TESCAN MAGNA UHR SEM delivers unparalleled nanoscale imaging and analytical performance for next-generation material systems.
Engineered for sub-nanometer resolution and equipped with SEM/STEM dual capability, it provides high-contrast, high-sensitivity imaging of nanotubes, catalysts, nanoparticles, and complex nanostructures.
With In-Flight Beam Tracing™ for automatic beam optimization and TriBE™/TriSE™ multi-detector systems for comprehensive signal collection, MAGNA represents the ultimate platform for nanoscale metrology, imaging, and analysis.
The TESCAN MAGNA is purpose-built for nanomaterials characterization at the sub-nanometer scale, combining ultra-high-resolution imaging with analytical versatility across SEM and STEM modes.
Designed for high-resolution and high-contrast imaging, MAGNA reveals the intricate structural, morphological, and compositional details of advanced materials such as catalysts, nanoparticles, carbon nanotubes, and layered nanostructures.
Its proprietary In-Flight Beam Tracing™ ensures the electron beam is always optimally configured, guaranteeing the best imaging conditions automatically.
Meanwhile, the TriBE™ (Triple Backscattered Electron) and TriSE™ (Triple Secondary Electron) detector systems provide multi-angle signal detection, enabling precise topographic, compositional, and crystallographic insight at the nanoscale.
Powered by the Essence™ modular software platform, MAGNA streamlines every stage of operation — from beam setup and imaging to data capture and analysis — ensuring smooth workflows for both novice and expert users.
Sub-Nanometer Resolution — Achieve ultra-fine imaging detail for nanostructures, catalysts, and other next-generation materials.
SEM/STEM Analytical Platform — Dual-mode capability for surface and internal nanoscale characterization.
In-Flight Beam Tracing™ — Guarantees real-time, automated optimization of beam parameters for superior image stability and clarity.
TriBE™ and TriSE™ Multi-Detector Systems — Collect multiple signals simultaneously for comprehensive topographical and compositional analysis.
High-Contrast Imaging — Ideal for low-voltage, surface-sensitive investigations of beam-sensitive materials.
Essence™ Modular Software Platform — Provides intuitive control and advanced analytical functionality for all skill levels.
User-Friendly Operation — Fast setup, guided workflows, and robust automation minimize setup time and maximize productivity.
Engineered for the Nanoscale. Perfected for the Future.
The TESCAN MAGNA Ultra High-Resolution SEM empowers researchers to explore the sub-nanometer world with unmatched clarity and precision.
Featuring In-Flight Beam Tracing™, TriBE™/TriSE™ detection, and SEM/STEM dual-mode analysis, MAGNA sets the new benchmark for nanomaterials characterization, advanced surface metrology, and nanoscale imaging.
For laboratories pushing the boundaries of nanotechnology, catalysis, and materials innovation, MAGNA delivers clarity, confidence, and complete control — all in one platform.
| Parameter | Specification |
|---|---|
| Technology Platform | Ultra High-Resolution Analytical SEM (SEM/STEM) |
| Resolution (Achievable) | Sub-nanometer scale (subject to installation and beam conditions) |
| Beam Control | In-Flight Beam Tracing™ for automated optimization |
| Detector System | Multi-detector configuration with TriBE™ and TriSE™ |
| Analytical Capability | SEM imaging and STEM metrology at sub-nanometer scale |
| Imaging Modes | SE, BSE, STEM, Analytical (EDS/WDS compatible) |
| Software Platform | Essence™ modular interface with automation and guided workflows |
| Operation | Fast setup, automated beam alignment, and simplified imaging conditions |
| Sample Compatibility | Ideal for nanostructured, beam-sensitive, or low-Z materials |
| Applications | Nanomaterials, catalysts, composites, semiconductors, biological nanostructures |
Nanomaterial Imaging & Analysis
Detailed visualization of nanoparticles, nanotubes, and quantum structures at sub-nanometer precision.
Catalyst & Energy Material Characterization
High-contrast imaging of porous catalysts, electrode structures, and nanoscale interfaces.
Thin Film and Interface Studies
Analyze cross-sections and layered materials with exceptional depth and compositional accuracy.
STEM Mode Nano-Metrology
Combined SEM/STEM functionality for simultaneous surface and transmission-based nanoanalysis.
Academic & Industrial Research
Supports advanced research workflows in nanotechnology, surface chemistry, and material development.
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