Name: Tescan SOLARIS X 2
Brand: Tescan
SKU: INVPOFWY
Availability: InStock

Tescan SOLARIS X 2 Supplier in India | Labindia Instruments

Tescan SOLARIS X 2

INVPOFWY

Brand: Tescan

Category: Microscope - Scanning Electron

Industry: Semiconductors, Material Science & Chemistry

Plasma FIB-SEM for high-throughput semiconductor failure analysis and Ga⁺-free sample prep

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SOLARIS X 2 gives you Mistral™ Xe Plasma FIB, UHR SEM imaging, and artifact-free Rocking Stage cross-sectioning for modern failure-analysis workflows. Support fast defect localization, Xe-based TEM prep, and processing of complex stacks and packaging.

Curtaining-free cross-sections: TRUE X-sectioning delivers deep, high-current cross-sections in heterogeneous stacks and polymers.
Ga+-free TEM prep: A fast, inert Xe plasma FIB system offloads high-volume TEM prep and frees capacity on conventional Ga+ FIBs.
Standardized FA workflows: Intuitive end-pointing, automated alignment, and guided wizards improve speed and repeatability.

Tescan SOLARIS X 2 Supplier in India | Labindia Instruments