The TESCAN MIRA XR™ is a next-generation Field Emission Scanning Electron Microscope (FE-SEM) engineered to deliver ultra-high-resolution imaging, fast analytical performance, and intelligent workflow automation for advanced research and industrial applications. Developed by TESCAN, a Shimadzu Company, the MIRA XR™ combines innovative technologies such as BrightBeam™, In-Flight Beam Tracing™, Wide Field Optics™, Dual Essence™ EDS, MultiVac™, and VisualCoder™ to provide exceptional imaging quality, reproducibility, and ease of operation. Its optimized electron optics ensure stable beam conditions and consistent nanometer-scale imaging, while automated alignment and calibration simplify operation for both experienced researchers and first-time SEM users. Wide Field Optics™ enables seamless navigation from large-area sample overviews to nanoscale details, significantly reducing the time required to locate regions of interest. Integrated Dual Essence™ EDS accelerates elemental analysis by providing up to twice the data acquisition speed with reduced detector shading, enabling fast and accurate chemical mapping. The MultiVac™ system allows reliable imaging of charging, porous, beam-sensitive, and outgassing samples without conductive coating, preserving delicate specimens while minimizing sample preparation time. VisualCoder™ further enhances productivity by enabling intuitive drag-and-drop automation of imaging and analytical workflows, reducing operator intervention and increasing laboratory efficiency. The TESCAN MIRA XR™ is widely used in semiconductor inspection, nanotechnology, advanced materials research, metallurgy, battery research, electronics, life sciences, geology, quality control, and failure analysis, delivering high-performance imaging and comprehensive analytical capabilities for today's most demanding scientific challenges.
Labindia Instruments Pvt. Ltd. is the authorized distributor of TESCAN, a Shimadzu Company, in India, providing expert application support, installation, training, and nationwide service to help researchers and industries maximize the performance of their electron microscopy solutions.
