A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization
Key Benefits :
- High throughput, large area FIB processing up to 1 mm
- Ga-free microsample preparation
- Ultra-high resolution, field-free FEG-SEM imaging and analysis
- In-lens SE and BSE detection
- Resolution optimization for high-throughput, multi-modal FIB-SEM tomography
- Superior field of view for easy navigation
- Essence? easy-to-use, modular graphical user interface