TESCAN AMBER X | FIB-SEM Solutions for Material Sciences

TESCAN AMBER X

TESCAN AMBER X

A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization

Key Benefits :
  • High throughput, large area FIB processing up to 1 mm
  • Ga-free microsample preparation
  • Ultra-high resolution, field-free FEG-SEM imaging and analysis
  • In-lens SE and BSE detection
  • Resolution optimization for high-throughput, multi-modal FIB-SEM tomography
  • Superior field of view for easy navigation
  • Essence? easy-to-use, modular graphical user interface

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