UHR SEM for nanomaterials characterization at sub-nanometer scale
Key Benefits :
- High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
- Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
- Fast setup of the electron beam ? optimal imaging conditions are guaranteed by the In-Flight Beam TracingTM
- Multi-detector system TriBETM and TriSETM for sample nanocharacterization
- Intuitive software modular platform designed for effortless operation regardless users' skill level