Advanced UHR SEM and STEM imaging for characterization of your biological and beam-sensitive samples
Key Benefits :
- UHR imaging of non-conductive beam sensitive samples at low-kV
- A routine investigation of heavy-metal stained ultra-thin sections with excellent contrast using the In-beam BSE detector at extremely low kV
- Easy-to-use STEM detector as a cost-effective alternative to routinely used TEM
- Compatibility with major cryo-system suppliers on the market
- Easy-to-use, fully customizable, application-oriented and modular user interface